P. Keitler, B. Becker, G. Klinker Management of Tracking for Industrial AR Setups The Ninth IEEE and ACM International Symposium on Mixed and Augmented Reality, Seoul, Korea, Oct. 13 - 16, 2010, pp. 73-82. (bib)
	The accuracy of a real time tracking system for industrial AR (IAR) applications often needs to comply with production toler- ances. Such a system typically incorporates different off-/online devices so that the overall precision and accuracy cannot be triv- ially stated. Additionally, tracking needs to be flexible to not inter- fere with existing working processes and it needs to be operated and maintained free of error by on-site personnel who typically have a quality management (QM) background. For the �nal validation of such a complex tracking setup, empiric testing alone is either too expensive or lacks generality. This paper demonstrates a new approach to de�ne and verify, de- ploy and validate, as well as to operate and maintain an IAR track- ing infrastructure. We develop our concepts on the basis of an IAR application in the �eld of QM in the aircraft production process. It integrates a qualitative visual comparison with accurate quantitative measurements of 3D coordinates using a metrological probe. The focus is on the veri�cation, validation, and error free operation. Monte Carlo simulation predicts the error for arbitrary system states. Using a limited set of empiric measurements in the target environment allows us to validate the simulation and thereby val- idate the application. This combination assures compliance of the IAR application with the required production tolerances. We show that our simulation model yields realistic results, using an in-depth analysis of an optical IR tracking system and a high- precision coordinate measurement machine capable of densely sampling the entire tracking volume. Additionally, it allows for a straightforward derivation of run-time consistency checks for the automatic identi�cation of possible system failures. Also, estima- tion of the system performance during the planning and de�nition phases becomes possible, using the elementary accuracy speci�ca- tions of the involved sensor systems.
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